HAYNES® 556® exhibits reasonable retained ductility after long term thermal exposure at intermediate temperatures. It does not exhibit significant sigma phase formation even after 16,000 hours exposure at 1000 to 1600°F(540 to 870°C). Principal phases precipitated from solid solution are carbides and carbonitrides. |
Room-Temperature Tensile Properties of Bar Following Thermal Exposure* |
Exposure
Temperature |
Hours
|
Ultimate
Tensile Strength |
Yield Strength
at 0.2% Offset |
Elongation in
2 in. (50.8 mm) |
°F |
°C |
Ksi |
MPa |
Ksi |
MPa |
% |
|
1200 |
650 |
0 |
113.4 |
780 |
62.5 |
430 |
46.5 |
|
|
1000 |
120.5 |
830 |
59.7 |
410 |
36.0 |
|
|
4000 |
121.2 |
835 |
57.4 |
395 |
33.0 |
|
|
8000 |
127.3 |
880 |
59.8 |
410 |
29.4 |
|
1400 |
760 |
0 |
113.4 |
780 |
62.5 |
430 |
46.5 |
|
|
1000 |
128.7 |
885 |
60.8 |
420 |
24.8 |
|
|
4000 |
127.1 |
875 |
57.4 |
395 |
25.8 |
|
|
8000 |
125.1 |
865 |
54.6 |
375 |
24.7 |
|
1600 |
870 |
0 |
113.4 |
780 |
62.5 |
430 |
46.5 |
|
|
1000 |
112.9 |
780 |
52.3 |
360 |
32.8 |
|
|
4000 |
111.5 |
770 |
42.8 |
295 |
29.0 |
|
|
8000 |
108.1 |
745 |
43.9 |
305 |
29.5 |
| * Average of three tests for each condition. |
|
|
Elevated-Temperature Tensile Properties of Bar Following 16,000-Hour Thermal Exposures* |
Test
Temperature |
|
Ultimate
Tensile Strength |
Yield Strength
at 0.2% Offset |
Elongation in
2 in. (50.8 mm) |
°F |
°C |
Ksi |
MPa |
Ksi |
MPa |
% |
|
1000 |
537 |
|
95.7 |
660 |
37.4 |
260 |
48.0 |
1200 |
648 |
|
88.8 |
610 |
37.8 |
260 |
23.4 |
1400 |
760 |
|
72.3 |
500 |
35.1 |
240 |
25.3 |
1600 |
871 |
|
42.1 |
290 |
21.9 |
150 |
29.5 |
|
|
|
Room-Temperature Tensile Properties of Sheet Following 1000-Hour Thermal Exposures* |
Test
Temperature |
|
Ultimate
Tensile Strength |
Yield Strength
at 0.2% Offset |
Elongation in
2 in. (50.8 mm) |
°F |
°C |
Ksi |
MPa |
Ksi |
MPa |
% |
|
Room |
Room |
|
118.1 |
815 |
59.5 |
410 |
47.7 |
1200 |
648 |
|
118.4 |
815 |
53.4 |
370 |
37.9 |
1400 |
760 |
|
118.8 |
820 |
53.8 |
370 |
17.0 |
1600 |
871 |
|
111.0 |
765 |
46.6 |
320 |
20.4 |
|
| * Average of two or more tests |
|
|
|